Site Survey Systems

Combining the measurements and analysis of magnetic fields, vibrations and acoustics into one compact, easy to operate system, Spicer Consulting's SC11 is the simplest way to gain accurate usable data from site surveys for SEMs and similar sensitive equipment.

Spicer Consulting magnetic field cancelling systems can stabilise the ambient magnetic field to restore the resolution and accuracy of an electron beam tool. Our systems stabilise the field by dynamically creating nearly equal and opposite field changes. 

Discover our range of  field cancelling systems, including the latest SC24 , SC22 and SC26.

 Consulting & Installation

With over 70 years of combined experience providing practical expertise in SEM and e-beam tools, we provide a wide range of consulting services. 

From installation support, through to the modelling of magnetic fields for a custom installation, we have the expertise to help you.

Latest News and Knowledge

24 Oct, 2023
We are pleased to announce that our distributor, Herzan LLC., will represent Spicer Consulting at ISTFA 2023. The ISTFA conference will be held on November 12-16th at Phoenix, Arizona. If you would like to learn how our Magnetic Field Cancelling System and SC28 Monitoring System may help improve the images of your electron microscopes, electron beam lithography systems, CD-SEMs, and focused ion beam tools, please stop by Booth #423. Contact Spicer Consulting Limited Contact Herzan LLC
05 May, 2023
The unparalleled magnification capabilities of electron microscopes (EMs) make them indispensable for applications requiring nanometre scale imaging. However, the sensitivity required to operate at such high magnification levels leaves them vulnerable to magnetic field perturbations, vibration and changes in temperature and humidity, all of which need to be kept to a minimum to ensure peak performance. Keeping track of such environmental factors is no mean feat, but dedicated continuous monitoring systems are now available to detect changes in instrument surroundings in real time, simplifying troubleshooting procedures and ensuring optimal device performance. Blurred lines The superior magnification offered by EMs stems from the use of electrons instead of light to probe a sample; the wavelength of these particles can be many orders of magnitude shorter than photons on the visible spectrum, enabling them to resolve much smaller features. The beam of electrons is focused on the specimen, and interacts with atoms in the sample to produce signals that contain information about surface topography and composition. Seeing details at such a small scale requires the beam to be perfectly positioned and focused, which can be compromised by external interferences from acoustic noise and vibrations, leading to blurred images. Additionally, since the electrons are charged particles, EM performance is also greatly affected by external magnetic fields. This leads to distinct artefacts appearing in the image; AC fields often show up as sharp jagged edges, while DC fields create wavy lines. EM manufacturers therefore precisely map and specify the degree of interference that their instruments can handle before the image quality drops below the acceptable limit.
04 May, 2023
Spicer Consulting donated new Microsoft tablets to Clophill St Mary's Lower School and Nursery, and pay for the setting up and installation. We are thrilled that the tablets will be used by the children to complete their computing work. See details: https://www.facebook.com/clophillstmarysschool/posts/pfbid02tojRSLop1oFZfNz8d6HTwJQvYCgF7TVRXG9dmEpqS6gHc5ivX9C5P6gjThhyfEddl

Protecting your Investment in Electron Beam Technology

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